David Pommerenke

ESDEMC科技公司技术顾问

David Pommerenke

技术顾问, IEEE Fellow 

Dr. Pommerenke从公司成立以来一直是我们的技术顾问。他对静电放电 (ESD) 和电磁兼容性 (EMC) 的深入了解极大地帮助了我们的团队研发我们的许多产品。

Professional Preparation

1989

Technical University Berlin, Germany, B.S.E.E

1995

Technical University Berlin, Germany, Ph.D.E.E

Appointments

2020 - Present

Professor, Technical University Graz, Austria

2008 - 2019

Professor, Missouri University of Science and Technology, Department of Electrical & Computer Engineering

2001 - 2008

Associate Professor, Missouri University of Science and Technology, Department of Electrical & Computer Engineering

1996 - 2001

EMC Research and Test Engineer at Hewlett Packard, Roseville, CA

1995 - 1996

Post-Doc at the Technical University Berlin, Germany

1990 - 1995

Research Assistant, Institute for High Voltage and Power Eng. Technical University Berlin, Germany

Synergistic Activities

2020 - Present

Associated Editor of the IEEE Transactions on EMC

Previously

US-representative to IEC TC77b

Member IEEE EMC Society, TC-9, Computational Electromagnetics

1996 - 2000

Editorial Board, EOS/ESD Symposium on EMC

2002

Editorial Board European EMC

Member IEEE, Electromagnetic Compatibility and Dielectrics and Electrical Insulation society

Graduate Advisors and Postdoctoral Sponsors

Masters: Prof. Dr.-Ing Wilfried Kalkner

Doctoral: Prof. Dr.-Ing W. Wilfried Kalkner

Five Most Relevant Publications

  1. Ghasr, Mohammad Tayeb, Mohamed A. Abou-Khousa, Sergey Kharkovsky, R. Zoughi, and David Pommerenke. “Portable real-time microwave camera at 24 GHz.” Antennas and Propagation, IEEE Transactions on, 2012, 60, no. 2, pp. 1114-1125.
  2. Fallahpour, M., M. Baumgartner, A. Kothari, M.T. Ghasr, D. Pommerenke and R. Zoughi, “Compact Ka-Band One-Port Vector Reflectometer using a Wideband Electronically-Controlled Phase-Shifter,” IEEE Transactions on Instrumentation and Measurement, October 2012, Vol. 61, no. 10, pp. 2817-2826
  3. Bishop, J. A.; Pommerenke, D. J.; Chen, G., ‘,A Rapid-Acquisition Electrical Time-Domain Reflectometer for Dynamic Structure Analysis ‘, IEEE Trans. Instrumentation and Measurement, 2011, Vol. 60/2 pp. 655-661,
  4. Muchaidze, G.Jayong KooQing CaiTun LiLijun HanMartwick, A.Kai WangJin MinDrewniak, J.L.Pommerenke, D., “Susceptibility Scanning as a Failure Analysis Tool for System-Level Electrostatic Discharge (ESD) Problems”, IEEE Trans. EMC, May 2008, Vol 50, No. 2, pp.268-276
  5. Koo, J., Cai, Q.; Muchaidze, G.,Martwick, A., Wang, K.; Pommerenke, D., “Frequency-Domain Measurement Method for the Analysis of ESD Generators and Coupling”, IEEE Trans. EMC, 49/3, August 2007, pp.504-511

Other Publications

  1. Tianqi Li; Maeshima, J.; Shumiya, H.; Pommerenke, D.J.; Yamada, T.; Araki, K, “An application of utilizing the system-efficient-ESD-design (SEED) concept to analyze an LED protection circuit of a cell phone”, Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on, August 2012, pp. 346-350
  2. Khilkevich, V.; Pommerenke, D.; Li Gang; Xu Shuai, “An inductive probe for the measurement of common mode currents on differential traces”, Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on, 2012, pp. 720-724
  3. Jianmin Zhang; Drewniak, J.L.; Pommerenke, D.J.; DuBroff, R.E.; Zhiping Yang; Wheling Cheng; Fisher, J.; Camerlo, S.; “Signal link-path characterization up to 20 GHz based on a stripline structure”, IEEE Int. Symp. on EMC, 2006 14-18 Aug. Vol. 2, pp.356-361
  4. Bhargava, A.; Pommerenke, D.; Kam, K.W.; Centola, F.; Cheng Wei Lam; , “DC-DC Buck Converter EMI Reduction Using PCB Layout Modification,” Electromagnetic Compatibility, IEEE Transactions on , Vol.53, no.3, pp.806-813, Aug. 2011
  5. Abou-Khousa, M.A.; Ghasr, M.T.; Kharkovsky, S.; Pommerenke, D.; Zoughi, R.; , “Modulated Elliptical Slot Antenna for Electric Field Mapping and Microwave Imaging,” Antennas and Propagation, IEEE Transactions on , Vol.59, no.3, March 2011, pp.733-741

Collaborators & Other Affiliations

  • Daryl Beetner, James L. Drewniak, Richard E. DuBroff, and David Pommerenke, members of the Electromagnetic Compatibility Laboratory at the Missouri University of Science and Technology
  • Bruce Archambeault, Distinguished Engineer, IBM, TRP, NC;
  • Brice Achkir, Distinguished Engineer, Cisco, San Jose, CA;