TLP and VF-TLP testing can provide a comprehensive ESD characterization for devices. TLP (pulse width of 100ns, typically) is often used to generate an IV curve which can be analyzed to understand many of a device’s ESD protection characteristics such as dynamic resistance, trigger voltage, hold voltage, and current, and second breakdown (Vt2/It2). A VF-TLP test is often used to understand the transient response of a DUT. Initial voltage peak and turn-on time can be measured and may play a large role in choosing the best protection device for a design. When analyzing this data, it is important to understand the device under protection and the system operating conditions.

• TLP Configuration                tr <1 ns, tp=100 ns
• VF-TLP Configuration           tr <0.2 ns, tp= 10 ns
• For more test configurations, please refer to our Transmission Line Pulse (TLP) testing service.