PB2012.09 An application of utilizing the system-efficient-ESD-design (SEED) concept to analyze an LED protection circuit of a cell phone

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An application of utilizing the system-efficient-ESD-design (SEED) concept to analyze an LED protection circuit of a cell phone
Tianqi Li #1, Junji Maeshima *2, Hideki Shumiya*3, David J. Pommerenke#4, Takashi Yamada*5, Kenji Araki*6

# EMC laboratory, Missouri University of Science and Technology, 4000 Enterprise Dr., Rolla, MO, 65401, USA, tlx6f; 4 [email protected]
* Sony Corporation, Sony City, 1-7-1 Kounan Minato-ku, Tokyo, 108-0075, Japan
2 Junji.Maeshima; 3 Hideki.Shumiya; 5 TakashiB.Yamada; [email protected]

 

Abstract—An LED circuit of a cell phone is analyzed using the System-Efficient-ESD-Design (SEED) methodology [1]. The method allows simulation of the ESD current path, and the interaction mechanisms between the clamp and the on-chip ESD protection circuit. The I-V curve and the non-linear behavior under high current pulses of every component including R, L, C, and ferrite beads are measured and modeled. By combining all of the component models, a complete circuit model is built for predicting the circuit behavior and damaging threshold at a given setting-voltage of a Transmission Line Pulser (TLP).