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TR002 PV Module Diodes TLP Test Report

SEM image of die surface from ESD damaged PV bypass diode sample, melted metal and silicon observed

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Bypass and blocking diodes inserted across the strings of the solar panel arrays are found to be susceptible to potential electrostatic discharge (ESD) events. The objective is to explain the theory behind the ESD damage and the proper test and analysis methods for ESD failure of PV module diodes. To demonstrate the proposed test methodology, some diode models supplied by a solar panel arrays manufacturer were evaluated.


by Wei Huang, Jerry Tichenor, Yingjie Gan, David Pommerenke,