ES62X-SSM System Switch Module

The ES62x-SSM System Switch Module (Previous Model ES62X-LTKSEM or A621-LTKSEM) provides a consistent and reliable means for automatically switching a device under test (DUT) between a Pulsed IV Curve system and a DC characterization system. In the normally closed state, the TLP pulse is applied to the DUT to capture the Pulsed IV Curve, and the voltage measuring Pick Tee is connected to the oscilloscope for the VDUT measurement. In the normally open state, the DUT is connected to a source meter unit (SMU), and the Pick Tee is open circuited so as to not provide another path to ground for the SMU measurement. ES62x-SSM has very low triboelectricity which is used for very sensitive low voltage devices (several volts and below) of e.g. very advanced CMOS or MMIC process technologies.

Features

  • Designed for high performance VF-TLP/TLP/HMM systems
  • Low Triboelectricity (several volts and below )
  • DC-18 GHz bandwidth
  • 2 synchronous switched SPDT channels
  • 6 SMA interfaces
  • LED switching indicator
  • Designed for up to 3kV or 120A TLP systems
  • High reliability switching life time (> 1,000,000 times)

Description

ES62X-SSM System Switch Module Datasheet (PDF)

 1.    Description

The ES62x-SSM System Switch Module (Previous Model ES62X-LTKSEM or A621-LTKSEM) provides a consistent and reliable means for automatically switching a device under test (DUT) between a Pulsed IV Curve system and a DC characterization system. In the normally closed state, the TLP pulse is applied to the DUT to capture the Pulsed IV Curve, and the voltage measuring Pick Tee is connected to the oscilloscope for the VDUT measurement. In the normally open state, the DUT is connected to a source meter unit (SMU), and the Pick Tee is open circuited so as to not provide another path to ground for the SMU measurement. ES62x-SSM has very low triboelectricity which is used for very sensitive low voltage devices (several volts and below) of e.g. very advanced CMOS or MMIC process technologies.

2.    Features

  • Designed for high performance VF-TLP/TLP/HMM systems
  • Low Triboelectricity (several volts and below )
  • DC-18 GHz bandwidth
  • 2 synchronous switched SPDT channels
  • 6 SMA interfaces
  • LED switching indicator
  • Designed for up to 3 kV or 120 A 1000 ns TLP systems
  • High reliability switching life time (> 1,000,000 times)

3.    Applications

  • Generic Test System Switching Module

4.    Specifications

Parameters Values Unit Comments
Working Bandwidth DC-18 GHz See S-Parameters in page 3
Characteristic Impedance 50 W
Insertion Loss < 0.8 dB Voltage Measurement Path and Pulsed DUT Path
Breakdown > 3 kV Designed for up to 3 kV or 120 A 1000 ns TLP systems
Triboelectricity < 5 V Tested < 2 V, <1 ns @ 25 °C and 30 % Condition
Operate & Release Time < 20 ms Tested for 1,000,000 times
Overall Dimension 120 X 50 X 40 mm Including connectors
Weight 0.215 kg

Note: Adding external common mode suppression is recommended for the path to DUT in high frequency tests, such as TLP, vf-TLP, HMM, HBM, LV-Surge, etc… The actual test setup and injection pulse shape should determine the external common mode suppression structure.

 

5.    Ordering Information

Line Part # or Option # Description
1 ES62X-SSM DC-18 GHz System Switch Module

 

6.    Additional/Optional Leakage Measurement Equipment

Line Part # or Option # Description
1 ES62x-LTP Leakage Test SMU ESD Protector