ES62X-LVS Low Voltage Surge System

The model ES62X-LVS low voltage surge system, outputting a lightning characteristic described in the IEC 61000-4-5 standard, is designed for testing the surge immunity of devices at both wafer and package levels. Determination of ESD failure thresholds is made easy using one of the available ESD waveforms and curve tracing capabilities.

The pulse source design and pulse source delivery method ensures waveform performance directly at the device under test, not at the generator output. Current waveforms can be captured and analyzed for each ESD event. In addition, voltage waveforms can be captured and used to determine the turn-on level of protection structures. They can also be used as a means of failure determination, as the voltage waveforms show changes after pulse events.

Features

  • Waveform very clean and linear up to 500 V
  • Fully isolated surge pulsing circuit
  • Software controlled automatic measurement
  • Automatic failure detection includes DC spot check and static IV

Description

Model ES62X-LVS Low Voltage Surge System Datasheet (PDF)

1. Description

The Model ES62X-LVS Low Voltage Surge System, outputting lightning characteristic waveforms described in the IEC 61000-4-5, GR-1089-CORE, and C62.45-2002 standards, is designed for testing the surge immunity of devices at both wafer and package levels. Determination of ESD failure thresholds is made easy using one of the available ESD waveforms and curve tracing capabilities.

The pulse source design and pulse source delivery method ensures waveform performance directly at the device under test, not at the generator output. Current waveforms can be captured and analyzed for each ESD event. In addition, voltage waveforms can be captured and used to determine the turn-on level of protection structures. They can also be used as a means of failure determination, as the voltage waveforms show changes after pulse events.

2. Features

  • Waveform clean and linear from 1V to 500 V
  • Fully isolated surge pulsing circuit
  • Software controlled automatic measurement
  • Automatic failure detection includes DC spot check and static IV

3. Applications

  • Test the surge pulse immunity for power supply, drive PCBs, communication systems, LCD display panels per IEC61000-4-5 8/20µs specification
  • Test the surge pulse immunity for wafer, packaged and PCB surge/OS immunity
  • 10/1000µs test for wafer, packaged, PCB and system surge immunity

4. Specifications

Parameters LVS-500-8/20 Option LVS-500-10/1000 Option Unit
Output Voltage (Open Load) 1 – 500 1 – 500 V
Output Current (Short Load) 0.5 – 250 0.12 – 55 A
Output Precision ± 5 % ± 5 % %
Output Resistance 2 ± 10% 9 ± 10%
Short Circuit Current Front Time 8 ± 20 % 10 – 40 % µs
Short Circuit Current Time-to-Half 20 ± 20 % 1000 +20 % µs
Open Circuit Voltage Front Time 1.2 ± 30 % 10 – 40 % µs
Open Circuit Voltage Time-to-Half 50 ± 20 % 1000 +50 % µs
Dimensions 347 X 300 X 145 mm
Weight 12 kg
Voltage Probe Passive voltage divider probe, 101:1
Current Probe Passive current probe, 0.1 V/A

5. Ordering Information

Line Part # or Option # Description

Low Voltage Surge IV-Curve System

1.0 ES62X-LVS Model ES62X-LVS Low Voltage Surge System
1.1 LVS-500-8/20 Low Voltage Surge 8/20 Module, Max 500V
1.2 LVS-500-10/1000 Low Voltage Surge 10/1000 us Module, Max 500V

Additional Options

2.1 KSMU2400 SMU, 200V, 1A, 20W, Single Channel (For device DC automation failure check))
2.2 ES62X-CMPS Compact Manual Probe Station
2.3 ES62X-XYZM-TIM XYZ Micropositioner – Inline model, XYZ travel 500 mils with 0.01mm per step
2.4 ES62X-XYZM-PAA PCB Probe Arm Assembly with Voltage Measurement (Type C X1, Type B X2)
2.5 ES62X-XYZM-GAA GND Probe Arm Assembly
2.6 ES62X-XYZM-PP048 048 Pogopin Probing Tip
2.7 ES62X-XYZM-PP075 075 Pogopin Probing Tip
2.8 ES62X-XYZM-TN1 Tungsten Needles – 5 mils Probing Tip