A capacitively-coupled transmission line pulser, or CC-TLP, allows a user to generate CDM-like pulses with greater control and repeatability than standard JS-002 CDM testers, and it is done so with a vf-TLP rather than a CDM tester. A CC-TLP probe fixture and a vf-TLP setup are all that is needed to study a device’s response to CDM stress. The typical vf-TLP pulse setting for this application is typically a pulse width and rise time of 1ns and 100ps, respectively.
ESDEMC Technology will soon be releasing its CC-TLP probing solution as an add-on to the existing vf-TLP solutions. Special software support will be included. The CC-TLP solution will eventually offer options of automatic calibration and device probing, which is the first on the market. Calibration and probing can also be performed manually using the tilt-adjustment knobs and the micropositioners to which the CC-TLP probing head easily mounts.
Below is a plot that shows a transient data comparison between ESDEMC’s CDM, RP-CCDM, and CCTLP.