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David Pommerenke

technical consultant of ESDEMC Technology Company

David Pommerenke

Technology Consultant, IEEE Fellow 

Dr. Pommerenke has been our technical consultant from the founding of ESDEMC Technology. His in-depth knowledge of Electrostatic Discharge (ESD) and Electromagnetic Compatibility (EMC) has greatly helped our team in the research and development of many of our products.

Professional Preparation

1989

Technical University Berlin, Germany, B.S.E.E

1995

Technical University Berlin, Germany, Ph.D.E.E

Appointments

2020 - Present

Professor, Technical University Graz, Austria

2008 - 2019

Professor, Missouri University of Science and Technology, Department of Electrical & Computer Engineering

2001 - 2008

Associate Professor, Missouri University of Science and Technology, Department of Electrical & Computer Engineering

1996 - 2001

EMC Research and Test Engineer at Hewlett Packard, Roseville, CA

1995 - 1996

Post-Doc at the Technical University Berlin, Germany

1990 - 1995

Research Assistant, Institute for High Voltage and Power Eng. Technical University Berlin, Germany

Synergistic Activities

2020 - Present

Associated Editor of the IEEE Transactions on EMC

Previously

US-representative to IEC TC77b

Member IEEE EMC Society, TC-9, Computational Electromagnetics

1996 - 2000

Editorial Board, EOS/ESD Symposium on EMC

2002

Editorial Board European EMC

Member IEEE, Electromagnetic Compatibility and Dielectrics and Electrical Insulation society

Graduate Advisors and Postdoctoral Sponsors

Masters: Prof. Dr.-Ing Wilfried Kalkner

Doctoral: Prof. Dr.-Ing W. Wilfried Kalkner

Five Most Relevant Publications

  1. Ghasr, Mohammad Tayeb, Mohamed A. Abou-Khousa, Sergey Kharkovsky, R. Zoughi, and David Pommerenke. “Portable real-time microwave camera at 24 GHz.” Antennas and Propagation, IEEE Transactions on, 2012, 60, no. 2, pp. 1114-1125.
  2. Fallahpour, M., M. Baumgartner, A. Kothari, M.T. Ghasr, D. Pommerenke and R. Zoughi, “Compact Ka-Band One-Port Vector Reflectometer using a Wideband Electronically-Controlled Phase-Shifter,” IEEE Transactions on Instrumentation and Measurement, October 2012, Vol. 61, no. 10, pp. 2817-2826
  3. Bishop, J. A.; Pommerenke, D. J.; Chen, G., ‘,A Rapid-Acquisition Electrical Time-Domain Reflectometer for Dynamic Structure Analysis ‘, IEEE Trans. Instrumentation and Measurement, 2011, Vol. 60/2 pp. 655-661,
  4. Muchaidze, G., Jayong Koo, Qing Cai, Tun Li, Lijun Han, Martwick, A., Kai Wang, Jin Min, Drewniak, J.L., Pommerenke, D., “Susceptibility Scanning as a Failure Analysis Tool for System-Level Electrostatic Discharge (ESD) Problems”, IEEE Trans. EMC, May 2008, Vol 50, No. 2, pp.268-276
  5. Koo, J., Cai, Q.; Muchaidze, G.,Martwick, A., Wang, K.; Pommerenke, D., “Frequency-Domain Measurement Method for the Analysis of ESD Generators and Coupling”, IEEE Trans. EMC, 49/3, August 2007, pp.504-511

Other Publications

  1. Tianqi Li; Maeshima, J.; Shumiya, H.; Pommerenke, D.J.; Yamada, T.; Araki, K, “An application of utilizing the system-efficient-ESD-design (SEED) concept to analyze an LED protection circuit of a cell phone”, Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on, August 2012, pp. 346-350
  2. Khilkevich, V.; Pommerenke, D.; Li Gang; Xu Shuai, “An inductive probe for the measurement of common mode currents on differential traces”, Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on, 2012, pp. 720-724
  3. Jianmin Zhang; Drewniak, J.L.; Pommerenke, D.J.; DuBroff, R.E.; Zhiping Yang; Wheling Cheng; Fisher, J.; Camerlo, S.; “Signal link-path characterization up to 20 GHz based on a stripline structure”, IEEE Int. Symp. on EMC, 2006 14-18 Aug. Vol. 2, pp.356-361
  4. Bhargava, A.; Pommerenke, D.; Kam, K.W.; Centola, F.; Cheng Wei Lam; , “DC-DC Buck Converter EMI Reduction Using PCB Layout Modification,” Electromagnetic Compatibility, IEEE Transactions on , Vol.53, no.3, pp.806-813, Aug. 2011
  5. Abou-Khousa, M.A.; Ghasr, M.T.; Kharkovsky, S.; Pommerenke, D.; Zoughi, R.; , “Modulated Elliptical Slot Antenna for Electric Field Mapping and Microwave Imaging,” Antennas and Propagation, IEEE Transactions on , Vol.59, no.3, March 2011, pp.733-741

Collaborators & Other Affiliations

  • Daryl Beetner, James L. Drewniak, Richard E. DuBroff, and David Pommerenke, members of the Electromagnetic Compatibility Laboratory at the Missouri University of Science and Technology
  • Bruce Archambeault, Distinguished Engineer, IBM, TRP, NC;
  • Brice Achkir, Distinguished Engineer, Cisco, San Jose, CA;